Test System and Methodology
Our approach to storage testing targets long-term performance with a high level of granularity. Many testing methods record peak and average measurements during the test period. These average values give a basic understanding of performance, but fall short in providing the clearest view possible of I/O QoS (Quality of Service).
While under load, all storage solutions deliver variable levels of performance. 'Average' results do little to indicate performance variability experienced during actual deployment. The degree of variability is especially pertinent, as many applications can hang or lag as they wait for I/O requests to complete. While this fluctuation is normal, the degree of variability is what separates enterprise storage solutions from typical client-side hardware.
Providing ongoing measurements from our workloads with one-second reporting intervals illustrates product differentiation in relation to I/O QOS. Scatter charts give readers a basic understanding of I/O latency distribution without directly observing numerous graphs. This testing methodology illustrates performance variability, and includes average measurements, during the measurement window.
IOPS data that ignores latency is useless. Consistent latency is the goal of every storage solution, and measurements such as Maximum Latency only illuminate the single longest I/O received during testing. This can be misleading, as a single 'outlying I/O' can skew the view of an otherwise superb solution. Standard Deviation measurements consider latency distribution, but do not always effectively illustrate I/O distribution with enough granularity to provide a clear picture of system performance. We utilize high-granularity I/O latency charts to illuminate performance during our test runs.
Our testing regimen follows SNIA principles to ensure consistent, repeatable testing, and utilizes multithreaded workloads found in typical production environments. We measure power consumption during precondition runs. This provides measurements in time-based fashion, with results every second, to illuminate the behavior of power consumption in steady state conditions. We also present IOPS-to-Watts measurements to highlight efficiency.
The Intel DC S3500, Samsung 845DC EVO and Micron M500DC feature 480GB of capacity. The OCZ Intrepid is 400GB. The SSDs are tested over their full LBA range to highlight performance at maximum utilization. The first page of results will provide the 'key' to understanding and interpreting our test methodology.
PRICING: You can find products similar to this one for sale below.
United States: Find other tech and computer products like this over at Amazon's website.
United Kingdom: Find other tech and computer products like this over at Amazon UK's website.
Canada: Find other tech and computer products like this over at Amazon Canada's website.
Recommended for You
- We at TweakTown openly invite the companies who provide us with review samples / who are mentioned or discussed to express their opinion of our content. If any company representative wishes to respond, we will publish the response here.
Latest News Posts
- Steam introduces Histograms to prevent review bombing
- i-rocks introduces K60M PLUS RGB mechanical keyboard
- Overwatch's next hero is playable, but wont be out soon
- PS4 & Xbox One cross-play briefly enabled for Fortnite
- Thermaltake reveal the Versa H18 Window Micro case
- Using Netgear wndr3700 as router extender problem
- A Look at AMD's Threadripper CPU Hardware Modes
- Plextor M8Se 256GB & 512GB NVMe PCIe SSD Review
- ad240ehdgmbox on m3a785gmh/128m mainboard?
- 8K benched: RX Vega 64 vs. GTX 1080 Ti vs. TITAN Xp SLI
- In Win Launches 'Wood-infused' 305 Mid-Tower PC Chassis
- Micron appoints Anand Jayapalan as Storage Business Unit Vice President
- Bluehole, Inc and Microsoft announce expanded partnership for PlayerUnknown's Battlegrounds
- Optimize system performance with new drive adapter
- Lian Li reveals new PC-Q39 tempered glass Mini-ITX tower