4k Random Read/Write
We precondition the 1.6TB Samsung XS1715 for 15,000 seconds, or four hours, receiving performance reports every second. We plot this data to illustrate the drives' descent into steady state.
This dual-axis chart consists of 30,000 data points, with the IOPS on the left and the latency on the right. The red dots signify IOPS, and the grey dots are latency measurements during the test. We place latency data in a logarithmic scale to bring it into comparison range. The lines through the data scatter are the average during the test. This type of testing presents standard deviation and maximum/minimum I/O in a visual manner.
Note that the IOPS and Latency figures are nearly mirror images of each other. This illustrates that high-granularity testing gives our readers a good feel for latency distribution by viewing IOPS at one-second intervals. This should be in mind when viewing our test results below. This downward slope of performance only happens during the first few hours of use, and we present precondition results only to confirm steady state convergence.
Each level tested includes 300 data points (five minutes of one second reports) to illustrate performance variability. The line for each OIO depth represents the average speed reported during the five-minute interval. 4k random speed measurements are an important metric when comparing drive performance, as the hardest type of file access for any storage solution to master is small-file random. One of the most sought-after performance specifications, 4k random performance is a heavily marketed figure.
The Samsung XS1715 jumps to an early lead with a scorching average of 752,476 IOPS at 256 OIO (Outstanding I/O), the Intel DC P3700 averages 467,055 IOPS, the HGST FlashMAX II averages 350,532 IOPS, and the Micron P420m averages 724,958 IOPS. The XS1715 also leads the majority of the lower loadings, establishing a lead early and expanding through the remainder of the measurement window. The competition is not close in the 64 and 128 OIO columns.
Our Latency vs IOPS charts compare the amount of performance attained from each solution at specific latency measurements. Many applications have specific latency requirements. These charts present relevant metrics in an easy to read manner for readers who are familiar with their applications requirements. The arrays that are lowest and furthest to the right exhibit the most desirable latency characteristics.
The XS1715 dominates this test with a beastly average of 660,000 IOPS at .2ms, and the nearest competitor is 462,000 IOPS from the P3700.
The Samsung XS1715 averages 116,692 IOPS at 256 OIO, Intel DC P3700 averages 147,846 IOPS, the FlashMAX II averages 119,662 IOPS, and the P420m averages 98,304 IOPS. The XS1715 places third, but has a clearly defined performance envelope rivaled only by the FlashMAX II.
The Intel DC P3700 and the Micron P420m outpaced the XS1715 in latency-v-IOPS measurements with a 4k write workload.
Our write percentage testing illustrates the varying performance of each solution with mixed workloads. The 100% column to the right is a pure 4k write workload, and 0% represents a pure 4k read workload. Mixed I/O is a constant reality In VDI and other intensive applications, resulting in the I/O blender effect. The XS1715 has an obvious propensity for read-centric workloads, but also scores in line with the other competitors in heavier write workloads, with the exception of the Intel DC P3700, which takes the lead.
Latency measurements during the mixed workload testing reveal increasing latency as we head into heavier write mixtures. The XS1715 operates within a tight latency envelope, which is indicative of predictable performance, but latency falls behind the DC P3700 and FlashMAX II in mixed write workloads.
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