Test System and Methodology
We designed our approach to storage testing to target long-term performance with a high level of granularity. Many testing methods record peak and average measurements during the test period. These average values give a basic understanding of performance, but fall short in providing the clearest view possible of I/O QoS (Quality of Service).
While under load, all storage solutions deliver variable levels of performance. 'Average' results do little to indicate performance variability experienced during actual deployment. The degree of variability is especially pertinent, as many applications can hang or lag as they wait for I/O requests to complete. While this fluctuation is normal, the degree of variability is what separates enterprise storage solutions from typical client-side hardware.
Providing ongoing measurements from our workloads with one-second reporting intervals illustrates product differentiation in relation to I/O QOS. Scatter charts give readers a basic understanding of I/O latency distribution without directly observing numerous graphs. This testing methodology illustrates performance variability, and includes average measurements, during the measurement window.
IOPS data that ignores latency is useless. Consistent latency is the goal of every storage solution, and measurements such as Maximum Latency only illuminate the single longest I/O received during testing. This can be misleading, as a single 'outlying I/O' can skew the view of an otherwise superb solution. Standard Deviation measurements consider latency distribution, but do not always effectively illustrate I/O distribution with enough granularity to provide a clear picture of system performance. We utilize high-granularity I/O latency charts to illuminate performance during our test runs.
Our testing regimen follows SNIA principles to ensure consistent, repeatable testing, and utilizes multi-threaded workloads found in typical production environments. We tested the 1.6TB Samsung XS1715 against the 1.6TB Intel DC P3700, the 1.4TB Micron P420m and the 2.2TB HGST FlashMAX II
The first page of results will provide the 'key' to understanding and interpreting our test methodology.
PRICING: You can find products similar to this one for sale below.
United States: Find other tech and computer products like this over at Amazon's website.
United Kingdom: Find other tech and computer products like this over at Amazon UK's website.
Canada: Find other tech and computer products like this over at Amazon Canada's website.
Recommended for You
- We at TweakTown openly invite the companies who provide us with review samples / who are mentioned or discussed to express their opinion of our content. If any company representative wishes to respond, we will publish the response here.
Latest News Posts
- Nintendo Switch cartridge advantage killed by Lego game
- Apple veteran leaves for Oculus, will run VR hardware
- Razer servers fail again, profiles flicked to default
- Final 'Ghost in the Shell' trailer drops in
- Elon Musk wants to link your brain to a machine
- NZXT Kraken X52 Liquid CPU Cooler Review
- Window side panel for PC-V1020
- DDR3 RAM question
- AnyRactive GoTouch Portable Whiteboard Review
- GIGABYTE AX370-Gaming 5 (AMD X370) Motherboard Review
- MSI announces frosty limited edition Trident 3 Arctic gaming PC
- ADATA adds the i-Memory AI920 jet black flash drive
- FinalWire releases AIDA64 Extreme 5.90 benchmark software
- ASUS announces support for Intel Optane memory
- Thermaltake releases new View 28 RGB Gull-Wing window ATX mid-tower chassis series with Tt LCS Certified and unique 256-color RGB matrix design