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Micron P420m 1.4TB PCIe Enterprise SSD Review - Test System and Methodology

Micron P420m 1.4TB PCIe Enterprise SSD Review

Micron's P420m utilizes 25nm MLC NAND to deliver a competitive product for mainstream enterprise storage usage. Let's take a close look at it now. (NASDAQ:MU)

| PCIe SSDs in IT/Datacenter | Posted: Sep 13, 2013 9:16 pm
TweakTown Rating: 92%      Manufacturer: Micron

Test System and Methodology

 

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We utilize a new approach to HDD and SSD storage testing for our Enterprise Test Bench, designed specifically to target long-term performance with a high level of granularity.

 

Many testing methods record peak and average measurements during the test period. These average values give a basic understanding of performance, but fall short in providing the clearest view possible of I/O QoS (Quality of Service).

 

'Average' results do little to indicate the performance variability experienced during actual deployment. The degree of variability is especially pertinent, as many applications can hang or lag as they wait for I/O requests to complete. This testing methodology illustrates performance variability, and includes average measurements, during the measurement window.

 

While under load, all storage solutions deliver variable levels of performance. While this fluctuation is normal, the degree of variability is what separates enterprise storage solutions from typical client-side hardware. Providing ongoing measurements from our workloads with one-second reporting intervals illustrates product differentiation in relation to I/O QOS. Scatter charts give readers a basic understanding of I/O latency distribution without directly observing numerous graphs.

 

Consistent latency is the goal of every storage solution, and measurements such as Maximum Latency only illuminate the single longest I/O received during testing. This can be misleading, as a single 'outlying I/O' can skew the view of an otherwise superb solution. Standard Deviation measurements consider latency distribution, but do not always effectively illustrate I/O distribution with enough granularity to provide a clear picture of system performance. We also use latency plots to illustrate latency scaling under various workloads.

 

Our testing regimen follows SNIA principles to ensure consistent, repeatable testing. We attain steady state through a process that brings the device within a performance level that does not range more than 20% during the measurement window. Forcing the device to perform a read-write-modify procedure for new I/O triggers all garbage collection and housekeeping algorithms, highlighting the real performance of the solution.

 

Our test pool features SSDs of varying capacity and it is important to bear this in mind when viewing results. The first page of results will provide the 'key' to understanding and interpreting our new test methodology.

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