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USA EditionYou are located: Home > All Press Releases > RAM Press Releases > JEDEC and ESD Association Publish New Revision to EDS Testing Standard

JEDEC and ESD Association Publish New Revision to EDS Testing Standard

Posted: Aug 17, 2011 12:18 pm | More Press Releases: RAM

jedec_and_esd_association_publish_new_revision_to_eds_testing_standard

 

JEDEC Solid State Technology Association and the ESD Association today announced the publication of ANSI/ESDA/JEDEC JS-001-2011 for Electrostatic Discharge Sensitivity (ESD) Testing - Human Body Model (HBM) - Component Level. The product of a ESDA /JEDEC agreement to produce joint standards in the field of device ESD sensitivity testing, the new revision represents a significant update over the prior version of the standard. ANSI/ESDA/JEDEC JS-001-2011 may be downloaded free of charge at http://www.ESDA.org or http://www.JEDEC.org.

 

The primary changes are described in a new pin combination table (Table 2A). The older set of combinations are still permitted and summarized in Table 2B. An expanded annex provides further guidance to allow the user to minimize the interaction between the HBM tester parasitics and the device under tests. This will allow for more accurate HBM tests.

 

The new ANSI/ESDA/JEDEC JS-001-2011 revision incorporates several important updates; they include a significant modification in the required pin combinations which will greatly reduce test times, increase productivity, reduce costs, and minimize false failures. These changes include:

 

• Most non-supply to non-supply (I/O-to-I/O) eliminated - testing is limited to differential pairs

• Eliminated "cross-domain" testing of non-supply (I/O) pins

• Pin combinations for two-pin testing clarified

• Use of "single polarity" supply-to-supply stressing allowed

 

The prior version of the new standard (JS-001-2010) merged two previously existing, similar test methods developed by ESDA and JEDEC, with the goal of establishing a unified procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). ESD can significantly impair the reliability and operation of solid state devices, and test methodologies are becoming ever more critical to the industry as technology advances and device complexity increases.

 

"ESDA is delighted to have collaborated with JEDEC to develop and publish these important updates to the HBM ESD standard, which we believe will be welcome news to manufacturers and suppliers in the solid state industry," said Donn Bellmore, President of the ESD Association.

 

John Kelly, President of JEDEC, added, "By joining forces to develop JS-001-2011, ESDA and JEDEC continue to respond to the industry's need for up-to-date test methods for HBM ESD. JEDEC looks forward continuing to work with ESDA on joint ESD standards that will meet the needs of the industry."


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